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<p><b>Seminario: LATEST ADVANCES IN HELIUM ION MICROSCOPY AND
NANOFABRICATION</b><br>
<b>Lugar</b>: Instituto de Nanociencia de Aragón (Seminario B)<br>
<b>Fecha</b>: 15/Febrero/2019. 10:30h.<br>
<b>Imparte</b>: Peter Gnauck (Zeiss)<br>
<b>Abstract</b>: Helium ion microscopy (HIM) is a new ion
microscopy technique with unsurpassed resolution in scanning
mode (0.25 nm). HIM equipment is currently commercialised by
Zeiss company, integrating He and Ne gas-field-ion sources.
Thus, the equipment can be additionally used for
high-resolution He and Ne nanofabrication. Latest developments
include compositional analysis by SIMS (secondary ion mass
spectroscopy).</p>
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<pre class="moz-signature" cols="72">--
Prof. José María De Teresa (<a class="moz-txt-link-abbreviated" href="mailto:deteresa@unizar.es" moz-do-not-send="true">deteresa@unizar.es</a>)
Phone numbers: +34 976762463 and +34 876555360
Address 1: ICMA, Facultad de Ciencias, Campus Plaza San Francisco, 50009 Zaragoza (Spain)
Address 2: LMA, INA, Edificio de I+D, Campus Río Ebro, 50018 Zaragoza
(Spain)
Webpage: <a class="moz-txt-link-freetext" href="https://nanofab-deteresa.com" moz-do-not-send="true">https://nanofab-deteresa.com</a></pre>
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